Thin Film Analytics
One of our core services we provide is the characterisation of optical thin films and layer systems. We determine the most important parameters of each layer including dispersion curves, spectral progression of refractive index, losses and thickness of your layer.
Furthermore we can determine the dispersion curve of your substrates as well as the spectral characteristics of your layer systems. For this task we use prism couplers by Metricon (m-line spectroscopy), reflection spectrometers, spectral photometers and optical spectrum analysers.
- X-Ray Diffraction Methods
(thickness, density, roughness)
- Spectroscopy of Thin Films
- M-Line Spectroscopy
(thickness, refractive index, extinction)