Investigation of coatings and (boundary) layers

Non-destructive coating thickness measurement

  • on plastic and anodised layers on non-magnetic base material
  • on metallisations, e.g. copper layers on printed circuit boards
  • Galvanic layers and lacquer layers on ferrous materials

Measurement methods

  • magnetic inductive (DIN EN ISO 2178)
  • magnetic (DIN EN ISO 2178) with eddy current (DIN EN ISO 2360)
  • electrical resistance (4 peaks)
  • X-ray absorption (XRF)

Destructive layer thickness measurement

  • for case-hardened and nitrided coatings
  • for galvanically grown (multiple) layers
  • for metallisations

Measurement methods

  • Light microscopy
  • Scanning electron microscopy

Determination of layer composition and phase inventory

the chemical composition can be determined for most layers, the determination of the phase state requires crystallinity

Measurement methods

  • Light microscopy / scanning electron microscopy
  • X-ray spectrometry (XRF or EDX in SEM)

Hardness determination

  • for case hardening and nitriding coatings for metallisations

Measurement methods

  • Vickers hardness testing

Mapping of defects in a coating and at the interface

  • in case of case-hardened, nitrided and anodised coatings (stress and hardening cracks, inclusions, etc.)
  • for galvanic coatings and metallisations (delaminations)
  • protective coatings (corrosion and reaction products, delamination, cracks)
  • for welds (bonding defects, blowholes, cracks)

Mapping methods

  • Mapping methods
  • Light microscopy (HF, DF, POL, DIC)
  • Scanning electron microscopy (HV, VP)

Dr.-Ing. Kerstin Kern

IMP Institut für Mikrotechnik und Photonik Projektleiterin und Fachverantwortliche Werkstoffprüfung

+41 58 257 34 08

Jan Allaart

IMP Institut für Mikrotechnik und Photonik Experte für Schadensanalyse

+41 58 257 33 75